The IEEE Conference on Visual Analytics Science and Technology (IEEE VAST), founded in 2006, is the first international conference dedicated to advances in Visual Analytics Science and Technology.  Previously named the “IEEE Symposium on Visual Analytics Science and Technology,” in 2011, IEEE VAST became an IEEE Conference for the first time.  The scope of the conference includes both fundamental research contributions within visual analytics, as well as applications of visual analytics in science, security, investigative analysis, engineering, medicine, health, media, business, and social interaction.  

IEEE VAST is one of three conferences that took place during VisWeek 2011 in Providence, Rhode Island, USA, on 23-28 October, 2011:

• IEEE Visualization 2011
• IEEE Information Visualization 2011
• IEEE Visual Analytics Science and Technology 2011

VisWeek is the premier forum for visualization advances for academia, government, and industry, bringing together researchers and practitioners with a shared interest in tools, techniques, technology and theory.  Throughout the week, a variety of papers, panels, workshops, tutorials, and posters, were presented for all three conferences, along with industry exhibitions, interactive demonstrations, a doctoral colloquium, and many impromptu birds-of-a-feather meetings among researchers and experts from the visualization community attending the conference.

For more information on the VAST program, visit: http://visweek.org/visweek/2011/info/vast-welcome/vast-welcome